XRF Light Elements Analysis

XRF Light Elements Analysis

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Light element analysis via handheld x-ray fluorescence used to be challenging. X-ray fluorescence depends on the ability of the detector to detect emitted fluorescent energies that are unique to each element (see XRF for Alloy Grade Analyzers). The lighter the element, or the lower its atomic number, the weaker its fluorescent energies and the shorter the distance that the energy can travel.

The light elements in the context of x-ray fluorescence are Magnesium (Mg), Aluminum (Al), Silicon (Si), Phosphorus (P), Sulfur (S), and Chlorine (Cl).

Why Can Light Element Analysis be Difficult using XRF?

Light elements have such weak fluorescent energies that it is difficult for them to travel the distance between the sample surface and the detector during XRF analysis, as they lose their energy within a very short distance. This makes detecting light elements with XRF challenging.

Our Solution for Light Element Analysis using Handheld XRF

A common solution to the XRF detection problem for light elements has been to create a vacuum or to use helium to purge the path between the sample surface and the detector. However, this is often inconvenient and expensive.

State-of-the-art detector technology has made these "fixes" largely unnecessary for alloy analysis. The TITAN uses a graphene-window Silicon Drift Detector (SDD) that transmits even weak XRF signals, facilitating their accurate measurement. The detection ability of its sensor makes TITAN ideal for light element analysis and the identification of aluminum alloys

If light element analysis and quantification are important for your alloy grade identification and sorting needs, be sure to choose the best technology available in portable XRF: the innovative SDD found in the Bruker TITAN – our XRF elemental analyzer that covers all of your needs!

XRF light elements being analyzed by Bruker S1 Titan

Bruker's XRF Analyzer for Light Elements

The Bruker TITAN not only provides the grade identification of most alloys in seconds along with complete quantitative alloy elemental composition, it also provides light element analysis without the need of a helium or vacuum purge. The detection of light elements with XRF is easily possible and takes only seconds.

The TITAN uses cutting-edge technology not only in its detector, but also in the form of SharpBeam technology. These innovations in beam geometry and detector make the TITAN an industry leader in terms of both speed and detection limits. The TITAN provides near laboratory-quality elemental composition determination, even for the light elements, and is well suited to a wide range of applications.

XRF elemental analyzer Bruker S1 Titan

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